View Issue Details
| ID | Project | Category | View Status | Date Submitted | Last Update |
|---|---|---|---|---|---|
| 0001082 | K18X001.00 SKB SWAN | HW | public | 2021-01-11 09:34 | 2021-12-24 11:38 |
| Reporter | (ALTech) Lonnie Kim | Assigned To | (HW) Tom Lee | Due Date | 2021-02-20 10:31 |
| Priority | normal | Severity | s2-severe | Reproducibility | always |
| Status | closed | Resolution | fixed | ||
| Summary | 0001082: [SWAN]DVT Test[USB2.0] | ||||
| Description | USB2.0 test - Adding USB Hub IC -Changing BT IC | ||||
| Tags | No tags attached. | ||||
| Attach Tags | |||||
| related to | 0001212 | closed | (ALTech) SH Son | [SWAN] DVT test item |
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0000926:0006299 Referred link. I requested adding USB Hub and BT USB test. But your test report is only 2 test. Could you explain more detail? Best regards Lonnie Kim |
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0000926:0006299 Referred link. I requested adding USB Hub and BT USB test. But your test report is only 2 test. Could you explain more detail? Best regards Lonnie Kim |
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Hi Lonnie, The USB2.0 SI report Tom provided including USB port 0 and port 1. The port 0 is represents the USB2.0 type A port on rear panel, and port 1 represents the USB3.0 type A IO port of the hub included in the loop. For the another USB port of Hub used for BT, we have verified the BT IC performance and RCU sensitivity, and all the performance are good. Therefore, we think it performance is OK. Do you agree with it? and let me know your thought. Thanks! Regards, Sean |
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Hi, Sean I understand what you said. But, according to your opinion, DUT aging test can alternate DDR test and flash test and other test including timing test. Because DUT okay means performance okay. If you don't agree my opinion, please tell me. Best regards Lonnie Kim |
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Hi Lonnie, I understand what you mean. The reason I say is because another hub USB2.0 for BT is connected directly to the IC. We definitely can verify that USB2.0 port but we have to rework USB trace on PCB board and try to connect it with a USB type A connector before measuring SI. In this case, I am afraid that the test results may be affected Regards, Sean |
| Date Modified | Username | Field | Change |
|---|---|---|---|
| 2021-01-11 09:34 | (ALTech) Lonnie Kim | New Issue | |
| 2021-01-11 09:34 | (ALTech) Lonnie Kim | Status | new => assigned |
| 2021-01-11 09:34 | (ALTech) Lonnie Kim | Assigned To | => (HW) Sean Chiang |
| 2021-01-11 09:35 | (ALTech) Lonnie Kim | Issue Monitored: (ALTech) Juyoung Park | |
| 2021-01-11 09:35 | (ALTech) Lonnie Kim | Issue Monitored: (ALTech) Lonnie Kim | |
| 2021-01-11 09:35 | (ALTech) Lonnie Kim | Issue Monitored: (ALTech) SH Son | |
| 2021-01-11 09:35 | (ALTech) Lonnie Kim | Issue Monitored: (ALTech) Sophie Lee | |
| 2021-01-11 09:35 | (ALTech) Lonnie Kim | Issue Monitored: (ALTech) SY Yoon | |
| 2021-01-11 09:35 | (ALTech) Lonnie Kim | Issue Monitored: (ALTech) Wooshin Kang | |
| 2021-01-11 09:35 | (ALTech) Lonnie Kim | Issue Monitored: (ALTech) Younkwang Jung | |
| 2021-01-11 09:35 | (ALTech) Lonnie Kim | Issue Monitored: (PM) Henry Chiou | |
| 2021-03-15 15:52 | (ALTech) Lonnie Kim | Note Added: 0006350 | |
| 2021-03-15 16:00 | (ALTech) Lonnie Kim | Note Added: 0006351 | |
| 2021-03-15 17:41 | (HW) Sean Chiang | Issue Monitored: (HW) Tom Lee | |
| 2021-03-15 17:41 | (HW) Sean Chiang | Issue Monitored: (RD) Fu-chiang Young | |
| 2021-03-15 19:18 | (HW) Sean Chiang | Issue Monitored: (HW) Catherine Chen | |
| 2021-03-15 19:54 | (HW) Sean Chiang | Note Added: 0006356 | |
| 2021-03-15 23:04 | (HW) Sean Chiang | Assigned To | (HW) Sean Chiang => (HW) Tom Lee |
| 2021-03-16 07:00 | (ALTech) Lonnie Kim | Note Added: 0006387 | |
| 2021-03-16 14:03 | (HW) Sean Chiang | Note Added: 0006396 | |
| 2021-04-29 09:28 | (ALTech) SH Son | Relationship added | related to 0001212 |
| 2021-12-24 11:38 | (HW) Sean Chiang | Status | assigned => closed |
| 2021-12-24 11:38 | (HW) Sean Chiang | Resolution | open => fixed |
